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"#Journals | #EPJ Applied Physics
"The reliability impact of N doping on the HfO2 charge-trapping layer: a first-principles study" 
✍️Fengyu Ye_from #WuhanUniversity

👀Explore the cutting-edge research in material science and semiconductor technology!
➡️ bit.ly/3WWSf0v

#EDPSciences #OpenAccess"

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